Tender detail
High-Temperature Semiconductor Curve-Tracing System
Summary
Fraunhofer IISB is procuring one high-temperature semiconductor curve-tracing system for the electrical characterisation of power semiconductors and power modules. The system will measure current-voltage characteristics and support testing of MOSFETs, SiC MOSFETs, diodes, IGBTs and GaN devices. The main supply is accompanied by optional measurement and switching functions, calibration and maintenance.
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