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Tender detail

Semiautomatic ellipsometer

Summary

KTH is procuring one spectroscopic ellipsometer with automatic wafer-mapping capability to measure thin-film thickness and optical constants (n, k). The instrument will be installed in the Electrum Laboratory cleanroom.

Reference number
701668-2026
Buyer
Kungliga Tekniska högskolan
Country
Sweden (SWE)
Procedure
Open procedure
CPV
38500000 Checking and testing apparatus
Deadline
2026-10-14
Status
Open
Contract subject
Supplies
Estimated value
134 000,00 EUR
Source
TED
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