Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers

Summary

IHP is procuring a semi-automatic system for electrical characterisation of 200 mm wafers for research and laboratory use. The system must support DC and pulsed I‑V measurements and low-frequency impedance measurements up to 10 MHz; multi-contact probes must enable RF measurements up to at least 6 GHz. The supply includes a prober with wafer loader, shielded chamber and vacuum chuck, stage, controls and computer, at least 6 individual probes and 10 spare probes, 2 multi-contact probe holders, a probe-card adapter, automated microscope and cameras, software, accessories, transport, installation, commissioning, documentation and one day of on-site training. Delivery must take no more than 26 weeks; the warranty must last at least 2 years, and the warranty-service response time must not exceed 5 working days. Tenders must be submitted electronically by 29 October 2026 at 12:00. Evaluation weights are price 50%, technical quality 40% and warranty 10%. The bidder must provide confirmation of commercial-register registration, technical information and the required declarations; the documents specify no particular turnover, reference-project or staff-experience thresholds.